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Measuring Volterra kernels of analog to digital converters using a stepped three-tone scan
Högskolan i Gävle, Institutionen för teknik och byggd miljö, Ämnesavdelningen för elektronik.ORCID-id: 0000-0001-5429-7223
Högskolan i Gävle, Institutionen för teknik och byggd miljö, Ämnesavdelningen för elektronik.ORCID-id: 0000-0003-2887-049x
2006 (engelsk)Inngår i: Proceedings of the IEEE Instrumentation and Measurement Technology Conference, 2006. IMTC 2006, 2006, s. 1047-1050Konferansepaper, Publicerat paper (Fagfellevurdert)
Abstract [en]

Volterra theory can be used to mathematically model nonlinear dynamic components such as analog-to-digital converter (ADC). This paper describes how frequency domain Volterra kernels of an ADC are determined from measurements. The elements of Volterra theory are given and practical issues are considered, such as methods for signal conditioning, finding the appropriate test signals scenario and suitable sampling frequency. The results show that for the used pipeline ADC, the frequency dependence is significantly stronger for second order difference products than for sum products and the linear frequency dependence was not as pronounced as that of the second order Volterra kernel.

sted, utgiver, år, opplag, sider
2006. s. 1047-1050
Serie
IEEE Instrumentation and Measurement Technology Conference, ISSN 1091-5281
Emneord [en]
analog to digital converters, ADC, Volterra kernels, test, measurements
HSV kategori
Identifikatorer
URN: urn:nbn:se:hig:diva-1902DOI: 10.1109/IMTC.2006.328342ISI: 000244176702019ISBN: 0-7803-9359-7 (tryckt)OAI: oai:DiVA.org:hig-1902DiVA, id: diva2:118564
Konferanse
23rd IEEE Instrumentation and Measurement Technology Conference, April 24-27, 2006, Sorrento, Italy
Tilgjengelig fra: 2007-11-16 Laget: 2007-11-16 Sist oppdatert: 2018-11-26bibliografisk kontrollert

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