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Stray-light corrections in integrating-sphere measurements on low-scattering samples
Department of Technology, Uppsala University, Uppsala, Sweden.ORCID-id: 0000-0003-2887-049X
Department of Technology, Uppsala University, Uppsala, Sweden.
1994 (Engelska)Ingår i: Applied Optics, ISSN 1559-128X, E-ISSN 2155-3165, Vol. 33, nr 25, s. 6092-6097Artikel i tidskrift (Refereegranskat) Published
Abstract [en]

A method for correcting integrating-sphere signals that considers differences in the angular distribution of scattered light is extended to sources of errors that are due to stray light from imperfect optical components. We show that it is possible to measure low levels of scattering, below 1%, by using a standard integrating sphere, provided that the various contributions to stray light are taken into account properly. For low-scattering samples these corrections are more important than those from the angular distribution of the scattering. A procedure for the experimental determination of stray-light components is suggested. Simple, easy to use, compact equations for the diffuse and specular reflectance and transmittance values of the sample as functions of the recorded signals are presented.

Ort, förlag, år, upplaga, sidor
1994. Vol. 33, nr 25, s. 6092-6097
Nyckelord [en]
Error analysis; Mass spectrometers; Spectrophotometers, Stray light components, Light scattering
Nationell ämneskategori
Fysik Elektroteknik och elektronik
Identifikatorer
URN: urn:nbn:se:hig:diva-23233DOI: 10.1364/AO.33.006092ISI: 1994PF32000039Scopus ID: 2-s2.0-0028511705OAI: oai:DiVA.org:hig-23233DiVA, id: diva2:1062920
Tillgänglig från: 2017-01-09 Skapad: 2017-01-05 Senast uppdaterad: 2018-03-13Bibliografiskt granskad

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