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Analog-to-Digital Converters for High-Speed Applications
Högskolan i Gävle, Institutionen för teknik och byggd miljö, Ämnesavdelningen för elektronik.ORCID-id: 0000-0001-5429-7223
2005 (engelsk)Inngår i: GigaHz 2005, 2005, s. 151-154Konferansepaper, Publicerat paper (Fagfellevurdert)
Abstract [en]

There is a rapid development of the performance of state-of-the-art analog to digital converters (ADC). Resolution and sampling rate are increasing continuously. Sampling rates in the high intermediate frequency (IF) range with sufficient dynamic range for communication applications were introduced about the turn of the millennium. Post-correction methods enable fast ADCs with modest linearity, and thereby weak dynamic performance, for high-speed applications.

A post-correction procedure involves a characterization of the ADC non-linearity and then utilizing this information by processing the ADC output samples to remove the distortion. ADC characterization is usually performed by estimating ADC characteristics from measurements. Consequently, successful characterizations require both developed test methods and high performance test-beds.

Characterization and testing ADCs are interesting in many different aspects. Not only that a proper characterization can be used for error compensation, testing is a major factor of cost for manufacturers, and shortening of the test cycle implies large savings. Testing ADCs is complicated, time consuming and demands high-performance instrumentation.

sted, utgiver, år, opplag, sider
2005. s. 151-154
Identifikatorer
URN: urn:nbn:se:hig:diva-1914OAI: oai:DiVA.org:hig-1914DiVA, id: diva2:118576
Konferanse
GigaHz 2005, 11 augusti - 11 september 2005, Uppsala, Sweden
Tilgjengelig fra: 2007-02-15 Laget: 2007-02-15 Sist oppdatert: 2018-03-13bibliografisk kontrollert

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