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Benefits with Truncated Gaussian Noise in ADC Histogram Tests
University of Gävle, Department of Technology and Built Environment, Ämnesavdelningen för elektronik.ORCID iD: 0000-0001-5429-7223
2004 (English)In: IMEKO 04, 2004, p. 787-792Conference paper, Published paper (Refereed)
Place, publisher, year, edition, pages
2004. p. 787-792
Identifiers
URN: urn:nbn:se:hig:diva-1957OAI: oai:DiVA.org:hig-1957DiVA, id: diva2:118619
Note
13th Symposium on Measurements for Research and Industrial Applications, 9th Workshop on ADC Modeling and Testing (IWADC), Athens, Greece, 2004Available from: 2007-02-15 Created: 2007-02-15 Last updated: 2018-03-13Bibliographically approved

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http://www.imeko.org/publications/iwadc-2004/IMEKO-IWADC-2004-001.pdf

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Björsell, Niclas

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CiteExportLink to record
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