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Histogram Tests for Wideband Applications
Högskolan i Gävle, Institutionen för teknik och byggd miljö, Ämnesavdelningen för elektronik.ORCID-id: 0000-0001-5429-7223
Signal Processing Laboratory, Royal Institute of Technology, Stockholm, Sweden.ORCID-id: 0000-0002-2718-0262
2008 (engelsk)Inngår i: IEEE Transactions on Instrumentation and Measurement, ISSN 0018-9456, E-ISSN 1557-9662, Vol. 57, nr 1, s. 70-75Artikkel i tidsskrift (Fagfellevurdert) Published
Abstract [en]

Characterization and testing of analog-to-digital converters (ADCs) are important in many different aspects. Histogram test is a common method to characterize the linearity features of an ADC. Two commonly used stimuli signals are sine waves and Gaussian noise. This paper presents a metrological comparison between Gaussian and sine wave histogram tests for wideband applications; that is we evaluate the performance in characterization of the ADC and the usability of post-correction. A post-correction procedure involves characterization of the ADC non-linearity and then use of this information by processing the ADC output samples to remove the distortion.

The results show that the Gaussian histogram test gives reasonable accuracy to measure non-linearities. However, it does not result in a suitable model for post-correction in wideband applications. A single-tone sine wave histogram will be a better basis for post-correction. Best result can be obtained if the look-up table is trained with several single-tone sine waves in the frequency band.

sted, utgiver, år, opplag, sider
2008. Vol. 57, nr 1, s. 70-75
Emneord [en]
Analog-to-digital converters (ADCs); Histogram; Measurements; Test
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Identifikatorer
URN: urn:nbn:se:hig:diva-2519DOI: 10.1109/TIM.2007.908274ISI: 000251947400010Scopus ID: 2-s2.0-43949129589OAI: oai:DiVA.org:hig-2519DiVA, id: diva2:119181
Tilgjengelig fra: 2007-12-19 Laget: 2007-12-19 Sist oppdatert: 2018-11-26bibliografisk kontrollert

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