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A technique to extend the bandwidth of an RF power amplifier test bed
University of Gävle, Department of Technology and Built Environment, Ämnesavdelningen för elektronik. Ericsson AB, Stockholm, Sweden; Signal Processing Laboratory, Royal Institute of Technology, Stockholm, Sweden.
University of Gävle, Department of Technology and Built Environment, Ämnesavdelningen för elektronik. Westerngeco AS, Asker, Norway..ORCID iD: 0000-0003-2887-049X
University of Gävle, Department of Technology and Built Environment, Ämnesavdelningen för elektronik. Signal Processing Laboratory, Royal Institute of Technology, Stockholm, Sweden.ORCID iD: 0000-0002-2718-0262
2007 (English)In: IEEE Transactions on Instrumentation and Measurement, ISSN 0018-9456, E-ISSN 1557-9662, Vol. 56, no 4, 1488-1494 p.Article in journal (Refereed) Published
Abstract [en]

In this paper, a method for increasing the bandwidth of a test bed for dynamic characterization of power amplifiers (PAs) is described. The technique is readily implemented using commercially available instruments, which makes it suitable for, e.g., production testing. The bandwidth extension technique is combined with coherent averaging of the measurements in order to simultaneously increase the bandwidth and dynamic range of the test bed. The errors in the obtained wideband signal are also estimated. The method is evaluated experimentally on a base station PA for the third-generation wideband code division multiple access system and on a Doherty amplifier. A tenfold increase in bandwidth to a total of 144 MHz and a more than 10-dB increase in dynamic range to 78 dB were obtained in practice. In addition, the obtained wideband signal is used for behavioral amplifier modeling.

Place, publisher, year, edition, pages
2007. Vol. 56, no 4, 1488-1494 p.
Keyword [en]
amplifier model, bandwidth extension, dynamic range, measurement system, power amplifier (PA), test bed
National Category
Electrical Engineering, Electronic Engineering, Information Engineering
Identifiers
URN: urn:nbn:se:hig:diva-22660DOI: 10.1109/TIM.2007.900101ISI: 000248235000052ScopusID: 2-s2.0-34547860353OAI: oai:DiVA.org:hig-22660DiVA: diva2:1040208
Conference
23rd IEEE Instrumentation and Measurement Technology Conference, APR 24-27, 2006, Sorrento, ITALY
Available from: 2016-10-26 Created: 2016-10-26 Last updated: 2017-01-02Bibliographically approved

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Rönnow, DanielHändel, Peter
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