Ellipsometric investigations of piezo-optical effects
1998 (English)In: Thin Solid Films, ISSN 0040-6090, E-ISSN 1879-2731, Vol. 313-314, 10-17 p.Article in journal (Refereed) Published
An introduction to the stress-induced birefringence of solids, with emphasis on cubic and amorphous materials, is given. Most available experimental data have been obtained in the frequency region below the electronic absorption edge: the corresponding coefficients of the stress-optical tensor are then real. Above the edge (and also in the IR region of the Reststrahlen) they become complex. Ellipsometry is an excellent tool for the investigation of complex stress-optical functions. It also yields the hydrostatic pressure induced changes in the dielectric functions. Data obtained recently for diamond and zincblende-type crystals and their theoretical interpretation are discussed.
Place, publisher, year, edition, pages
1998. Vol. 313-314, 10-17 p.
Amorphous films; Band structure; Birefringence; Diamonds; Electron absorption; Hydrostatic pressure; Tensors; Zinc, Dielectric functions; Stress optical constants, Ellipsometry
IdentifiersURN: urn:nbn:se:hig:diva-23220DOI: 10.1016/S0040-6090(97)00763-3ISI: 000073761700003ScopusID: 2-s2.0-0031998525OAI: oai:DiVA.org:hig-23220DiVA: diva2:1062377
2nd International Conference on Spectroscopic Ellipsometry (ICSE-2), 12-15 May 1998, Charleston, South Carolina, USA