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Surface roughness characterisation of a thin transparent dielectric-silver tandem by spectroscopic light scattering
Department of Materials Science, Uppsala University, Uppsala, Sweden.ORCID iD: 0000-0003-2887-049X
TiNOX GmbH, München, Germany.
Department of Materials Science, Uppsala University, Uppsala, Sweden.
1998 (English)In: Solar Energy Materials and Solar Cells, ISSN 0927-0248, E-ISSN 1879-3398, Vol. 52, no 1-2, p. 37-43Article in journal (Refereed) Published
Abstract [en]

Spectroscopic light scattering was measured on a system of a dielectric layer on top of a thin (13 nm) silver film on a glass substrate. The analysis included both forward and backward scattering and excellent agreement between measured and modelled results was achieved. The theoretical analysis showed that the film interfaces were correlated, i.e. the substrate roughness was replicated, and that the interface roughness (root mean square) was in the nanometer range.

Place, publisher, year, edition, pages
1998. Vol. 52, no 1-2, p. 37-43
Keywords [en]
roughness; dielectric-silver tandem; spectroscopic light scattering; MULTILAYER; FILMS
National Category
Electrical Engineering, Electronic Engineering, Information Engineering Physical Sciences
Identifiers
URN: urn:nbn:se:hig:diva-23248DOI: 10.1016/S0927-0248(97)00268-7ISI: 000073084700004Scopus ID: 2-s2.0-0032028218OAI: oai:DiVA.org:hig-23248DiVA, id: diva2:1062910
Available from: 2008-10-17 Created: 2017-01-05 Last updated: 2018-03-13Bibliographically approved

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Rönnow, Daniel

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