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Stray-light corrections in integrating-sphere measurements on low-scattering samples
Department of Technology, Uppsala University, Uppsala, Sweden.ORCID iD: 0000-0003-2887-049X
Department of Technology, Uppsala University, Uppsala, Sweden.
1994 (English)In: Applied Optics, ISSN 1559-128X, E-ISSN 2155-3165, Vol. 33, no 25, 6092-6097 p.Article in journal (Refereed) Published
Abstract [en]

A method for correcting integrating-sphere signals that considers differences in the angular distribution of scattered light is extended to sources of errors that are due to stray light from imperfect optical components. We show that it is possible to measure low levels of scattering, below 1%, by using a standard integrating sphere, provided that the various contributions to stray light are taken into account properly. For low-scattering samples these corrections are more important than those from the angular distribution of the scattering. A procedure for the experimental determination of stray-light components is suggested. Simple, easy to use, compact equations for the diffuse and specular reflectance and transmittance values of the sample as functions of the recorded signals are presented.

Place, publisher, year, edition, pages
1994. Vol. 33, no 25, 6092-6097 p.
Keyword [en]
Error analysis; Mass spectrometers; Spectrophotometers, Stray light components, Light scattering
National Category
Physical Sciences Electrical Engineering, Electronic Engineering, Information Engineering
Identifiers
URN: urn:nbn:se:hig:diva-23233DOI: 10.1364/AO.33.006092ISI: 1994PF32000039ScopusID: 2-s2.0-0028511705OAI: oai:DiVA.org:hig-23233DiVA: diva2:1062920
Available from: 2017-01-09 Created: 2017-01-05 Last updated: 2017-01-09Bibliographically approved

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