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Electrochromic control of thin film light scattering
Department of Technology, Uppsala University, Uppsala, Sweden.
Department of Technology, Uppsala University, Uppsala, Sweden.
Max-Planck-Institut für Festkörperforschung, Stuttgart ,Germany.ORCID iD: 0000-0003-2887-049X
Department of Technology, Uppsala University, Uppsala, Sweden.
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1997 (English)In: Journal of Applied Physics, ISSN 0021-8979, E-ISSN 1089-7550, Vol. 81, no 3, 1464-69 p.Article in journal (Refereed) Published
Abstract [en]

Total and diffuse reflectance spectra were measured on Al surfaces covered with electrochromic W oxide films in colored and bleached states. Vector perturbation theory was used for analyzing the spectra. The diffuse reflectance appeared to originate from correlated (uncorrelated) interface roughness when the W oxide film was fully colored (bleached). Assuming partially correlated interfaces led to agreement between experimental and calculated spectra. The use of an electrochromic film appears a promising method to control the relative contributions of the interfaces to the resulting scattering.

Place, publisher, year, edition, pages
1997. Vol. 81, no 3, 1464-69 p.
National Category
Physical Sciences Electrical Engineering, Electronic Engineering, Information Engineering
Identifiers
URN: urn:nbn:se:hig:diva-23243ISI: A1997WF01700072Scopus ID: 2-s2.0-0031079144OAI: oai:DiVA.org:hig-23243DiVA: diva2:1062942
Available from: 2008-10-17 Created: 2017-01-05 Last updated: 2017-01-09Bibliographically approved

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