Diffuse reflectance and transmittance spectra of an interference layer. 2. Evaluation of tin oxide-coated glass
1994 (English)In: Applied Optics, ISSN 1559-128X, E-ISSN 2155-3165, Vol. 33, no 34, 7918-7927 p.Article in journal (Refereed) Published
A model for the calculation of diffuse reflectance and transmittance of a single interference layer on a transparent substrate is applied to pyrolytically deposited tin oxide films on glass. Total as well as diffuse reflectance and transmittance spectra were measured in an integrating sphere, and scattering levels between 0.002 and 0.1 were recorded. The optical constants and the thickness of the films were determined from the total reflectance and transmittance spectra. The wavelength-dependent effectiveroot-mean-square roughness of aluminum-coated tin oxide front surfaces was determined by the application of the scalar scattering theory. Surface roughness values between 5 and 25 nm were obtained. The obtained effective rms roughness values of the air-film interface were used together with the other film parameters to calculate the diffuse reflectance and transmittance spectra of the tinoxide-coated glass substrates. A comparison between calculated and experimental spectra showed good agreement for diffuse reflectance, diffuse transmittance, and total integrated scattering spectra.
Place, publisher, year, edition, pages
1994. Vol. 33, no 34, 7918-7927 p.
Aluminum; Glass; Interfaces (materials); Light transmission; Mathematical models; Optical films; Optical variables measurement; Oxides; Reflection; Spectrum analysis; Surface roughness; Thickness measurement, Air water interface; Fresnel formalism; Interference layer; Optical constants; Reflectance; Root mean square roughness; Tin oxide; Total integrated scattering; Transmittance, Light scattering
IdentifiersURN: urn:nbn:se:hig:diva-23234DOI: 10.1364/AO.33.007918ISI: A1994PZ82300012ScopusID: 2-s2.0-0028743683OAI: oai:DiVA.org:hig-23234DiVA: diva2:1062985