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Dynamic behavior models of analog to digital converters aimed for post-correction in wideband applications
University of Gävle, Department of Technology and Built Environment, Ämnesavdelningen för elektronik.ORCID iD: 0000-0001-5429-7223
Royal Institute of Technology, Stockholm.ORCID iD: 0000-0002-2718-0262
2006 (English)In: IMEKO Workshop on ADC and DAC Modelling and Testing, September 17-22, 2006, Rio de Janeiro, 2006, p. 5-Conference paper, Published paper (Refereed)
Abstract [en]

In this paper a dynamic behavior model of analog to digital converters is proposed. The model is aimed for post correction in wideband applications. The suggested post correction method is a combination of look up tables and model based correction. The model consists of three components. The first is a component represented by a Hammerstein model; that is a static nonlinearity followed by a time invariant linear filter. The second component is a nonparametric model caused by significant deviation from the characterized integral nonlinearity and the output from the Hammerstein model. The third component contains of the remaining deviation and is considered as a random model error. Results from simulations verify that the examined ADC can be described by an ordinary Hammerstein model and a static look-up table.

Place, publisher, year, edition, pages
2006. p. 5-
National Category
Other Electrical Engineering, Electronic Engineering, Information Engineering
Identifiers
URN: urn:nbn:se:hig:diva-1644OAI: oai:DiVA.org:hig-1644DiVA, id: diva2:118306
Conference
IMEKO World Congress, September 17-22, 2006, Rio de Janeiro, Brazil
Available from: 2007-02-15 Created: 2007-02-15 Last updated: 2023-02-17Bibliographically approved

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Björsell, NiclasHändel, Peter

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CiteExportLink to record
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Citation style
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  • ieee
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  • sv-SE
  • en-GB
  • en-US
  • fi-FI
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  • nn-NB
  • de-DE
  • Other locale
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Output format
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  • text
  • asciidoc
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