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Truncated Gaussian noise in ADC histogram tests
University of Gävle, Department of Technology and Built Environment, Ämnesavdelningen för elektronik. (ITB/Electronics)ORCID iD: 0000-0001-5429-7223
Royal Institute of Technology, Signal Processing Laboratory, Stockholm, Sweden.
2007 (English)In: Measurement, ISSN 0263-2241, E-ISSN 1873-412X, Vol. 40, no 1, 36-42 p.Article in journal (Refereed) Published
Abstract [en]

One method to characterize analogue to digital converters (ADCs) is to use a histogram, where Gaussian noise may be used as stimulus signal. However, a Gaussian noise signal that excites all transition levels also generates input values outside working range of the ADC. Modern signal generators can generate arbitrary signals. Hence, excluding undesired values outside the ADC full scale can minimize test sequences. Truncating the signal to the working range gives further advantages, which are explored in this paper. The Cramér-Rao lower bound and a minimum variance estimator for histogram tests with an arbitrary stimulus are derived. These are applied for truncated Gaussian noise and the result is theoretically evaluated and compared to untruncated noise. It is shown that accuracy increases for a fixed sample length and that variation over transition levels decrease.

Place, publisher, year, edition, pages
2007. Vol. 40, no 1, 36-42 p.
Keyword [en]
ADC; CRLB; Histogram tests; MVE; Signal processing; Testing
National Category
Other Electrical Engineering, Electronic Engineering, Information Engineering
Identifiers
URN: urn:nbn:se:hig:diva-2333DOI: 10.1016/j.measurement.2006.05.005ISI: 000243833500006Scopus ID: 2-s2.0-33845450590OAI: oai:DiVA.org:hig-2333DiVA: diva2:118995
Available from: 2008-05-19 Created: 2008-05-19 Last updated: 2016-10-30Bibliographically approved

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CiteExportLink to record
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Citation style
  • apa
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Language
  • sv-SE
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  • nn-NB
  • de-DE
  • Other locale
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Output format
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  • text
  • asciidoc
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