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A Method for Device Intermodulation Analysis from 2D, TCAD Simulations using a Time-domain Waveform Approach
University of Gävle, Department of Technology and Built Environment, Ämnesavdelningen för elektronik.
2006 (English)In: Proceedings of the 36th European Microwave Conference, 2006, p. 169-171Conference paper, Published paper (Refereed)
Abstract [en]

This paper describes a fast method useful for IMD analysis at TCAD design level. The method is based on the static load-line transfer function extracted from 2D device simulations. The transfer function is exposed to a time domain signal through a look-up table and the output response is analyzed using the Fast Fourier Transform. The response is compared to measurements of a fabricated device. The method is shown to accurately predict the IMD behavior of a two-tone signal for the 3’rd, 5’th and 7’th order IMD products with regards to sweet spot tracking and relative IMD magnitude. We present a fast and simple way to predict IMD performance from TCAD simulations at an early stage in the design process. The method enables prediction of output response from any signal due to the time domain approach.

Place, publisher, year, edition, pages
2006. p. 169-171
Keywords [en]
TCAD, IMD
National Category
Other Electrical Engineering, Electronic Engineering, Information Engineering
Identifiers
URN: urn:nbn:se:hig:diva-2675DOI: 10.1109/EUMC.2006.281245ISBN: 2-9600551-6-0 (print)OAI: oai:DiVA.org:hig-2675DiVA, id: diva2:119337
Conference
36th European Microwave Conference, 10-15 September 2006
Available from: 2007-10-05 Created: 2007-10-05 Last updated: 2018-03-13Bibliographically approved

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Bengtsson, Olof

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CiteExportLink to record
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Citation style
  • apa
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  • ieee
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Language
  • sv-SE
  • en-GB
  • en-US
  • fi-FI
  • nn-NO
  • nn-NB
  • de-DE
  • Other locale
More languages
Output format
  • html
  • text
  • asciidoc
  • rtf