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Justification of mathematical imaging technique for the permittivity determination of layered dielectrics in a waveguide
University of Gävle, Faculty of Engineering and Sustainable Development, Department of Electrical Engineering, Mathematics and Science, Mathematics.
2019 (English)In: 2019 International Conference on Electromagnetics in Advanced Applications (ICEAA), 2019, p. 0143-0146Conference paper, Published paper (Refereed)
Abstract [en]

An introduction to mathematical imaging technique for solving inverse scattering problems is given. Applications are considered to inverse waveguide problems of recontructing permittivity of layered dielectric inclusions. The solution is justified of the inverse microwave imaging by establishing one-to-one correspondence between the sought quantities and the measured noisy data.

Place, publisher, year, edition, pages
2019. p. 0143-0146
Keywords [en]
Permittivity, Frequency measurement, Permittivity measurement, Noise measurement, Imaging, Dielectrics, Inverse problems, inverse scattering, waveguide, layer, dielectric
National Category
Electrical Engineering, Electronic Engineering, Information Engineering
Identifiers
URN: urn:nbn:se:hig:diva-30886DOI: 10.1109/ICEAA.2019.8879417Scopus ID: 2-s2.0-85074948304ISBN: 978-1-7281-0563-5 (electronic)OAI: oai:DiVA.org:hig-30886DiVA, id: diva2:1367946
Conference
2019 International Conference on Electromagnetics in Advanced Applications (ICEAA), 9-13 September 2019, Granada, Spain
Available from: 2019-11-05 Created: 2019-11-05 Last updated: 2019-11-25Bibliographically approved

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Shestopalov, Yury

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  • Other locale
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