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Characterizing the out-of-band nonlinear behaviour of RF devices: the key to success
University of Gävle, Center for RF Measurement Technologies. University of Gävle, Faculty of Engineering and Sustainable Development, Department of Electronics, Mathematics and Natural Sciences.
Vrije Universiteit Brussel . (ELEC)
Vrije Universiteit Brussel . (ELEC)
University of Gävle, Center for RF Measurement Technologies. University of Gävle, Faculty of Engineering and Sustainable Development, Department of Electronics, Mathematics and Natural Sciences.ORCID iD: 0000-0001-5429-7223
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2011 (English)In: 2011 IEEE International Instrumentation and Measurement Technology Conference (I2MTC), New York: IEEE conference proceedings, 2011, 790-794 p.Conference paper, Published paper (Refereed)
Abstract [en]

This paper presents a measurement recipe to characterize the out-of-band nonlinear behavior of RF devices when harmonic sampling is used as a digitizing technique. A major challenge to consider when using harmonic sampling is the overlapping of the aliased spectral bins of the digitized waveform. This challenge is more pronounced when using modulated excitation signals. In addition, the excitation signal used should mimic the real behavior of signals used in today's wireless systems. Hence, this paper provides the reader with a tool to select the proper excitation signal, sampling frequency and record length in order to achieve an accurate characterization of the nonlinear behavior of RF devices.

Place, publisher, year, edition, pages
New York: IEEE conference proceedings, 2011. 790-794 p.
Series
IEEE Instrumentation and Measurement Technology Conference, ISSN 1091-5281
National Category
Electrical Engineering, Electronic Engineering, Information Engineering
Identifiers
URN: urn:nbn:se:hig:diva-8514DOI: 10.1109/IMTC.2011.5944022ISI: 000297171900158Scopus ID: 2-s2.0-80051886176ISBN: 978-1-4244-7933-7 (print)ISBN: 978-1-4244-7935-1 (print)OAI: oai:DiVA.org:hig-8514DiVA: diva2:400521
Conference
2011 IEEE International Instrumentation and Measurement Technology Conference I2MTC, Hangzhou, China, 10-12 May 2011
Available from: 2011-02-25 Created: 2011-02-25 Last updated: 2016-08-10Bibliographically approved

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Nader, CharlesBjörsell, NiclasHändel, Peter
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CiteExportLink to record
Permanent link

Direct link
Cite
Citation style
  • apa
  • harvard-cite-them-right
  • ieee
  • modern-language-association-8th-edition
  • vancouver
  • Other style
More styles
Language
  • sv-SE
  • en-GB
  • en-US
  • fi-FI
  • nn-NO
  • nn-NB
  • de-DE
  • Other locale
More languages
Output format
  • html
  • text
  • asciidoc
  • rtf