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Industrial environment characterization for future M2M applications
University of Gävle, Faculty of Engineering and Sustainable Development, Department of Electronics, Mathematics and Natural Sciences, Electronics. KTH, School of Information and Communication Technology, Kista, Sweden . (EMI)
University of Gävle, Faculty of Engineering and Sustainable Development, Department of Electronics, Mathematics and Natural Sciences, Electronics. (EMI)ORCID iD: 0000-0001-5562-3182
University of Gävle, Faculty of Engineering and Sustainable Development, Department of Electronics, Mathematics and Natural Sciences, Electronics. (EMI)
University of Gävle, Faculty of Engineering and Sustainable Development, Department of Electronics, Mathematics and Natural Sciences, Electronics. FOI. (EMI)
2011 (English)In: Proc. 2011 IEEE International Symposium on Electromagnetic Compatibility, New York: IEEE conference proceedings, 2011, p. 960-963Conference paper, Published paper (Refereed)
Abstract [en]

Combining electronics, telecommunications, and information technology to connect devices and remote systems is perhaps the best feature of the future Machine-to-Machine (M2M) technology. Wireless communication technologies for managing future M2M applications are becoming mature, but electromagnetic interference and time dispersion in industrial environments can limit the successful functioning of these wireless systems, leading to a failure in the control of critical functions. The characterization of these environments is necessary for collecting and specifying M2M requirements. In this paper, we present the conclusions from measurements carried out in four different industrial environments during the past three years.

Place, publisher, year, edition, pages
New York: IEEE conference proceedings, 2011. p. 960-963
Series
IEEE International Symposium on Electromagnetic Compatibility, ISSN 2158-110X
National Category
Electrical Engineering, Electronic Engineering, Information Engineering
Identifiers
URN: urn:nbn:se:hig:diva-10599DOI: 10.1109/ISEMC.2011.6038447ISI: 000297048300170Scopus ID: 2-s2.0-80054758191ISBN: 978-1-4577-0810-7 (print)OAI: oai:DiVA.org:hig-10599DiVA, id: diva2:444956
Conference
2011 IEEE EMC Society International Symposium on Electromagnetic Compatibility, Long Beach, CA, USA, August 14-19, 2011
Projects
EMIAvailable from: 2011-09-30 Created: 2011-09-30 Last updated: 2018-03-13Bibliographically approved

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Ferrer Coll, JavierÄngskog, PerChilo, JoséStenumgaard, Peter

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