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ESS profiles with step stress level
University of Gävle, Faculty of Engineering and Sustainable Development, Department of Industrial Development, IT and Land Management. University of Gävle, Center for Logistics and Innovative Production. (Industriell ekonomi)
Guizho University.
Guizho University.
2011 (English)In: ICRMS'2011 - Safety First, Reliability Primary: Proceedings of 2011 9th International Conference on Reliability, Maintainability and Safety, 2011, 1156-1161 p.Conference paper, Published paper (Refereed)
Abstract [en]

Environmental Stress Screening (ESS) is usually referred to the process of exposing a product to environmental stresses for detecting and eliminating latent defects made in manufacturing process. The common ESS profiles are using thermal cycling, random vibration or their combinations as the screening stresses. Various guidelines and standards have been available for determining an ESS profile. Nevertheless, there are cases that the standard ESS profiles may not be efficient enough to detect the latent defects in some manufacturing process. This paper reports the results of one industrial project on the ESS profile design for circuits. In the project, a comparative study was carried out for the evaluation of the ESS strength under the ESS profiles with incremental step stresses (ISS). The ISS profile under the study is firstly to implement a step thermal cycling and then perform the test with two screening stimuli concurrently: ordinary thermal cycling and random vibration of step increasing intensity levels. For the purpose of the comparative study, the ESS test samples were consisted of two groups A and B that were made at two different levels of manufacturing: soldering by skilled and unskilled workers, respectively. The comparative study shows that the ISS profiles are effective for exposing the latent defects in sample group A and B. Based on the project results, an ESS profile is recommended in this paper.

Place, publisher, year, edition, pages
2011. 1156-1161 p.
National Category
Reliability and Maintenance
Identifiers
URN: urn:nbn:se:hig:diva-15389DOI: 10.1109/ICRMS.2011.5979445Scopus ID: 2-s2.0-80052448482ISBN: 978-1-61284-667-5 (print)OAI: oai:DiVA.org:hig-15389DiVA: diva2:650558
Conference
2011 9th International Conference on Reliability, Maintainability and Safety, Guiyang, 12-15 June 2011
Available from: 2013-09-23 Created: 2013-09-23 Last updated: 2013-09-26Bibliographically approved

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Zhao, Ming
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CiteExportLink to record
Permanent link

Direct link
Cite
Citation style
  • apa
  • harvard-cite-them-right
  • ieee
  • modern-language-association-8th-edition
  • vancouver
  • Other style
More styles
Language
  • sv-SE
  • en-GB
  • en-US
  • fi-FI
  • nn-NO
  • nn-NB
  • de-DE
  • Other locale
More languages
Output format
  • html
  • text
  • asciidoc
  • rtf