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Measurement imperfections impact on the performance of digitally predistorted power amplifiers
University of Gävle, Faculty of Engineering and Sustainable Development, Department of Electronics, Mathematics and Natural Sciences.
University of Gävle, Faculty of Engineering and Sustainable Development, Department of Electronics, Mathematics and Natural Sciences. Royal Institute of Technology, KTH. Signal Processing Laboratory, Stockholm, Sweden .ORCID iD: 0000-0001-8460-6509
University of Gävle, Faculty of Engineering and Sustainable Development, Department of Electronics, Mathematics and Natural Sciences.ORCID iD: 0000-0001-5429-7223
2014 (English)In: 2014 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) Proceedings, 2014, 230-233 p.Conference paper, Published paper (Refereed)
Abstract [en]

This paper presents an study of the impact of analog to digital converter (ADC) impairments on digital pre-distortion (DPD) techniques when applied to RF power amplifiers (PA). The DPD technique is described by a memory polynomial model while the ADC impairments are modeled by quantization noise, random jitter, and the integral nonlinearity (INL); thus, summarizing systematic and random nature of ADC imperfect measurements. It is observed that increased jitter will have a negative impact on the modeling but not so much on the output performance from the pre-distorted PA. Moreover, the ENOB can be used as metric for both the quantization noise and integral nonlinearity and there is a value of ENOB which, if exceeded, do not improve the DPD performance; in this paper it is about 8 bits.

Place, publisher, year, edition, pages
2014. 230-233 p.
Keyword [en]
Digital pre-distortion (DPD), Power amplifiers, Integral non-linearity (INL), quantization noise, jitter
National Category
Electrical Engineering, Electronic Engineering, Information Engineering
Identifiers
URN: urn:nbn:se:hig:diva-18893DOI: 10.1109/I2MTC.2014.6860742ISI: 000346477200046Scopus ID: 2-s2.0-84905716354ISBN: 978-1-4673-6386-0 (print)OAI: oai:DiVA.org:hig-18893DiVA: diva2:784745
Conference
IEEE International Instrumentation and Measurement Technology Conference (I2MTC), MAY 12-15, 2014, Montevideo, URUGUAY
Available from: 2015-01-30 Created: 2015-01-30 Last updated: 2016-08-10Bibliographically approved

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CiteExportLink to record
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Cite
Citation style
  • apa
  • harvard-cite-them-right
  • ieee
  • modern-language-association-8th-edition
  • vancouver
  • Other style
More styles
Language
  • sv-SE
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  • Other locale
More languages
Output format
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