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Guest Editorial Special Issue on the 2015 IEEE International Instrumentation and Measurement Technology Conference: Pisa, Italy, May 11-14, 2015
University of Ottawa, Canada.
University of Sannio, Italy.
University of Gävle, Faculty of Engineering and Sustainable Development, Department of Electronics, Mathematics and Natural Sciences, Electronics.
2016 (English)In: IEEE Transactions on Instrumentation and Measurement, ISSN 0018-9456, E-ISSN 1557-9662, Vol. 65, no 5, p. 958-959Article in journal, Editorial material (Refereed) Published
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2016. Vol. 65, no 5, p. 958-959
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Electrical Engineering, Electronic Engineering, Information Engineering
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URN: urn:nbn:se:hig:diva-21531DOI: 10.1109/TIM.2016.2539458ISI: 000374892500001Scopus ID: 2-s2.0-84964334516OAI: oai:DiVA.org:hig-21531DiVA, id: diva2:931702
Available from: 2016-05-30 Created: 2016-05-30 Last updated: 2018-03-13Bibliographically approved

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Van Moer, Wendy

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