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On Gaussian and Sine Wave Histogram Tests for Wideband Applications
University of Gävle, Department of Technology and Built Environment, Ämnesavdelningen för elektronik.ORCID iD: 0000-0001-5429-7223
2005 (English)In: IMTC 2005, Ottawa, 2005, p. 677-682Conference paper, Published paper (Refereed)
Place, publisher, year, edition, pages
2005. p. 677-682
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URN: urn:nbn:se:hig:diva-1946DOI: 10.1109/IMTC.2005.1604203OAI: oai:DiVA.org:hig-1946DiVA, id: diva2:118608
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IEEE Instrumentation and Measurement Technology Conference, Ottawa, Ontario, CANADA. 17-19 May 2005
Available from: 2007-02-15 Created: 2007-02-15 Last updated: 2025-10-02Bibliographically approved

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Björsell, Niclas

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CiteExportLink to record
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  • apa
  • harvard-cite-them-right
  • ieee
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