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Utveckling av ultraljud- och virvelströmsbaserad mätprob samt tjockleksmätningsinstrument för kombinerade material
University of Gävle, Faculty of Engineering and Sustainable Development, Department of Electrical Engineering, Mathematics and Science.
2020 (Swedish)Independent thesis Basic level (professional degree), 10 credits / 15 HE creditsStudent thesis
Abstract [sv]

Det här arbetet har utförts hos Sandvik SMT OFP och handlar om vidareutvecklingen av en prototypenhet som kombinerar EC- och UT-prober. Båda dessa mättekniker tillhör den överhängande gruppen som kallas oförstörande provning och är menade att felsöka material utan att inverka negativt på dem. Prototypen är tänkt att användas för att mäta skikttjocklek på compound-rör. Dessa rör består av två skikt varav ett är feritiskt kolstål, och det andra rostfritt stål. Det yttre, icke-feritiska skiktets tjocklek mäts med hjälp av EC-proben. Dettagörs genom att kalibrera proben mot ett testobjekt med kända tjocklekar mellan två av vilka en linjärisering utförs. Därefter placeras proben mot mätobjektet varpå mätningen jämförs mot linjäriseringen. Den totala tjockleken mäts med UT-proben och med dessa två mätningar blir även tjockleken av det feritiska skiktet känt. I tidigare system har EC- och UT-prober suttit separata och därmed har det funnits en risk att mätpunkterna för de två proberna har blivit osynkroniserade. Förhoppningen är att den kombinerade proben ska kunna utföra de två mätningarna samtidigt, på samma punkt för att minimera denna typ av fel. Arbetet visar att isolering av kopplingspunkter på proben kan räcka för att stabilisera EC-mätningar i vatten. Det förefaller rimligt att med mer arbete kunna driftsätta en kombinerad EC- och UT-prob samt att ett nytt instrument för hantering av EC-delen skall kunna designas.

Abstract [en]

This thesis work was conducted at Sandvik SMT OFP and deals with the further development of a prototype unit that combines EC- and UT-probes. Both of these probes associated measurement techniques belong to the greater group known as non-destructive testing and are intended to detect flaws in materials without negatively affecting them. The prototype is intended to to be used for measuring the thickness of compound tubes. These tubes consist of two layers, one of which is made of ferrous carbon steel, and the other of stainless steel. The outer, non-ferrous layers thickness will be measured with the EC-probe. This is accomplished through calibration with a well defined test object with sections of known thicknesses, between two of which a linearization is made. After calibration, the probe is placed against the object that is to be measured and the result from the EC-probe is compared to the linearization. The total thickness is measured by the UT-probe and with these two measurements the thickness of the ferrouslayer is indirectly known aswell. In earlier systems EC- and UT-probes have been separated and thus there were issues with desynchronization of measurements between the two probes.The combined probe is expected to make both types of measurements simultainiously, at the same point in order to reduce the risk of this type of error. This project shows that isolation of connections between probe and wire could suffice to stabilize EC-measurements in water. It appears reasonable to believe that with more work, Sandvik SMT OFP could use a combined EC- and UT-probe in production, and that a new instrument for handling the EC-measurements could be designed.

Place, publisher, year, edition, pages
2020. , p. 24
Keywords [en]
Non-destructive evaluation, Eddy currents
Keywords [sv]
Oförstörande provning, Virvelströmmar
National Category
Electrical Engineering, Electronic Engineering, Information Engineering
Identifiers
URN: urn:nbn:se:hig:diva-33092OAI: oai:DiVA.org:hig-33092DiVA, id: diva2:1449285
External cooperation
Sandvik SMT
Subject / course
Electronics
Educational program
Högskoleingenjör
Supervisors
Examiners
Available from: 2020-07-06 Created: 2020-06-30 Last updated: 2025-10-02Bibliographically approved

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Electrical Engineering, Electronic Engineering, Information Engineering

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Citation style
  • apa
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  • ieee
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  • sv-SE
  • en-GB
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  • nn-NB
  • de-DE
  • Other locale
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Output format
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  • text
  • asciidoc
  • rtf